API exhibited at EMV 2025

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API exhibited at EMV 2025 API (Amber Precision Instruments) exhibited at EMV 2025 in Stuttgart from March 25th to 27th to present SmartScan 350, a table-top EMI scanner and SmartZap, an automated Robotic ESD Gun tester. Thank you to everybody who stopped by our booth! https://youtube.com/watch?v=gtGvoiik3pk?si=BTn2AGh8xfHFSdcz

Oak-Mitsui Technologies and API exhibited at DesignCon 2025

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Our principals, API (Amber Precision Instruments) and Oak-Mitsui Technologies exhibited at DesignCon 2025, held at the Santa Clara Convention Center. API presented their EMI scanner SmartScan, and newly developed SmartScan-Precision for IC EMI scan. Oak-Mitsui presented embedded capacitance material FaradFlex, MicroThin and Low Profile Copper. Thank you to everybody who stopped by our booths!

Oak-Mitsui Technologies at IPC APEX 2023

Oak-Mitsui Technologies will exhibit at IPC APEX 2023 at San Diego Convention Center from 1/24-26 to present an embedded capacitance material called FaradFlex, Micro-Thin and low-profile copper. Please join us!!! 🙂

EMC Europe 2022

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Taiki Kitazawa from NAIST (Nara Institute of Science and Technology) presented a paper titled “Analysis of the PDN Induced Crosstalk Impacts on the High-Speed Signaling in Ultra-Thin and High Permittivity Substrates” at EMC Europe 2022 in Gothenburg last week.Great job and thanks Kitazawa-san for evaluating embedded capacitance material called FaradFlex from Oak-Mitsui Technologies and hope to […]

Happy New Year 2022

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Happy New Year 2022 from TechDream. We carry FaradFlex from Oak-Mitsui Technologies which is an embedded capacitance material, EMIStream from NEC which is an EMI design rule check and plane resonance analysis software, SmartScan from API which is a near-field EMI scanner and PCB materials from RISHO. If you are facing any EMI/SI/PI problems, please […]

DesignCon 2021 Wrap-Up

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Oak-Mitsui Technologies exhibited DesignCon 2021 at San Jose Convention Center to present FaradFlex and MicroThin. FaradFlex is an embedded capacitance material to improve SI/PI and mitigate EMI.